IEC 60115-1 PDF
IEC. QC Edition Fixed resistors for use in electronic equipment –. Part 1: Generic specification. Résistances fixes utilisées dans. Surge immunity testing for this study was conducted according to IEC standard , paragraph using the /50 μs waveform. Buy IEC Ed. Fixed resistors for use in electronic equipment Part 1: Generic specification from SAI Global.
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Harmonized system of quality assessment for electronic components. Standards Subscriptions from ANSI provides a money-saving, multi-user solution for 60115-11 standards. Proceed to Checkout Continue Shopping. Get to Know Us. As the voice of the U.
BS QC 400000:1990, IEC 60115-1:1982
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IEC 1 is a generic specification and is applicable to fixed resistors for use in electronic equipment It establishes standard terms inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose This standard cancels and replaces IEC 1 IEC 2 and IEC 2 1 This edition contains the following significant technical changes with respect to the previous edition a implementation of Annex Q which replaces Clause 3 b addition of new tests procedures in 4 34 through 4 38 c removal of the property temperature characteristics from 4 8 d introduction of a new system of test severities for the shear test in 4 32 e introduction of new bias voltages for the damp heat steady state test in 4 24 f furthermore this fourth edition cancels and replaces the third edition published in and constitutes minor revisions related to tables figures and references.
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Electronic equipment and components, Electrical components, Resistors, Fixed resistors, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification approvalElectrical insulation, Electrical testing, Thermal testing, Mechanical testing, Environmental testing, Endurance testing, Overvoltage tests, Fire tests, Resistance measurement, Temperature coefficient of resistance, Reactance measurement, Temperature rise, Solderability testing, Adhesion tests, Testing conditions, Test equipment, Circuits.
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